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1by Karkare, K. S., Ade, Peter A. R., Ahmed, Z., Aikin, R. W., Alexander, K. D., Amiri, M., Barkats, D., Benton, S. J., Bischoff, C. A., Bock, J. J., Bonetti, J. A., Brevik, J. A., Buder, I., Bullock, E. W., Burger, B., Connors, J., Crill, B. P., Davis, G., Dowell, C. D., Duband, L., Filippini, J. P., Fliescher, S. T., Golwala, S. R., Gordon, M. S., Grayson, J. A., Halpern, M., Hasselfield, M., Hildebrandt, S. R., Hilton, G. C., Hristov, V. V., Hui, H., Irwin, K. D., Kang, J. H., Karpel, E., Kefeli, S., Kernasovskiy, S. A., Kovac, J. M., Kuo, C. L., Leitch, E. M., Lueker, M., Mason, P., Megerian, K. G., Netterfield, C. B., Nguyen, H. T., O'Brient, R., Ogburn, R. W., Pryke, C. L., Reintsema, C. D., Richter, S., Schwarz, R.“...Society of Photo-optical Instrumentation Engineers...”
Published in SPIE Proceedings, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy VII (2014)
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2by Zmuidzinas, Jonas, Buder, I., Ade, Peter A. R., Ahmed, Z., Aikin, R. W., Alexander, K. D., Amiri, M., Barkats, D., Benton, S. J., Bischoff, C. A., Bock, J. J., Bonetti, J. A., Brevik, J. A., Bullock, E., Burger, B., Crill, B. P., Davis, G., Dowell, C. D., Duband, L., Filippini, J. P., Fliescher, S., Golwala, S. R., Gordon, M. S., Halpern, M., Hasselfield, M., Hildebrandt, S. R., Hilton, G. C., Hristov, V. V., Hui, H., Irwin, K. D., Karkare, K. S., Kaufman, J. P., Keating, B. G., Kefeli, S., Kernasovskiy, S. A., Kovac, J. M., Kuo, C. L., Leitch, E. M., Lueker, M., Mason, P., Megerian, K. G., Netterfield, C. B., Nguyen, H. T., O'Brient, R., Ogburn, R. W., Orlando, A., Pryke, C., Reintsema, C. D., Richter, S., Schwarz, R.“...Society of Photo-optical Instrumentation Engineers...”
Published in SPIE Proceedings, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy VII (2014)
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3by Ogburn, R. W., IV, Aikin, R. W., Bock, J. J., Bonetti, J. A., Brevik, J. A., Dowell, C. D., Filippini, J. P., Golwala, S. R., Hristov, V. V., Lange, A. E., Orlando, A., Runyan, M. C., Staniszewski, Z. K., Teply, G. P.“...Society of Photo-Optical Instrumentation Engineers (SPIE)...”
Published 2010
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4by Ogburn, R. W., IV, Aikin, R. W., Bock, J. J., Brevik, J. A., Dowell, C. D., Filippini, J. P., Golwala, S. R., Hristov, V. V., Hui, H., Lueker, M., Nguyen, H. T., O'Brient, R., Runyan, M. C., Staniszewski, Z. K., Teply, G. P.“...Society of Photo-Optical Instrumentation Engineers (SPIE)...”
Published 2012
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5by Sheehy, C. D., Aikin, R. W., Bock, J. J., Brevik, J. A., Dowell, C. D., Filippini, J. P., Golwala, S. R., Hristov, V. V., Lange, A. E., Lueker, M., Nguyen, H. T., Orlando, A., Runyan, M. C., Staniszewski, Z., Teply, G.“...Society of Photo-Optical Instrumentation Engineers (SPIE)...”
Published 2010
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6by Aikin, Randol W., Bock, J. J., Brevik, J. A., Dowell, C. D., Filippini, J. P., Golwala, S. R., Hristov, V. V., Lange, A. E., Nguyen, H. T., Orlando, A., Richter, S., Runyan, M. C., Teply, G. P.“...Society of Photo-optical Instrumentation Engineers (SPIE)...”
Published 2010
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7by Kernasovskiy, S., Aikin, R. W., Bock, J. J., Brevik, J. A., Dowell, C. D., Filippini, J. P., Golwala, S. R., Hristov, V. V., Lueker, M., Nguyen, H. T., O'Brient, R., Runyan, M. C., Staniszewski, Z., Teply, G.“...Society of Photo-Optical Instrumentation Engineers (SPIE)...”
Published 2012
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8by Brevik, J. A., Aikin, R. W., Bock, J. J., Dowell, C. D., Filippini, J. P., Golwala, S. R., Hristov, V. V., Lange, A. E., Nguyen, H. T., Orlando, A., Runyan, M., Staniszewski, Z.“...Society of Photo-optical Instrumentation Engineers (SPIE)...”
Published 2010
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9by Vieregg, A. G., Aikin, R., Bock, J. J., Brevik, J. A., Dowell, C. D., Filippini, J. P., Golwala, S. R., Hristov, V. V., Lueker, M., Nguyen, H. T., O'Brient, R., Runyan, M., Staniszewski, Z., Teply, G.“...Society of Photo-Optical Instrumentation Engineers (SPIE)...”
Published 2012
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10by Ogburn, R. W., IV, Aikin, R. W., Bock, J. J., Bonetti, J. A., Brevik, J. A., Dowell, C. D., Filippini, J. P., Golwala, S. R., Hristov, V. V., Lange, A. E., Orlando, A., Runyan, M. C., Staniszewski, Z. K., Teply, G. P.“...Society of Photo-Optical Instrumentation Engineers (SPIE)...”
Published in SPIE Proceedings, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy V (2010)
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11by Ogburn, R. W., IV, Aikin, R. W., Bock, J. J., Brevik, J. A., Dowell, C. D., Filippini, J. P., Golwala, S. R., Hristov, V. V., Hui, H., Lueker, M., Nguyen, H. T., O'Brient, R., Runyan, M. C., Staniszewski, Z. K., Teply, G. P.“...Society of Photo-Optical Instrumentation Engineers (SPIE)...”
Published in SPIE Proceedings, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy VI (2012)
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12by Vieregg, A. G., Aikin, R., Bock, J. J., Brevik, J. A., Dowell, C. D., Filippini, J. P., Golwala, S. R., Hristov, V. V., Lueker, M., Nguyen, H. T., O'Brient, R., Runyan, M., Staniszewski, Z., Teply, G.“...Society of Photo-Optical Instrumentation Engineers (SPIE)...”
Published in SPIE Proceedings, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy VI (2012)
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13by Brevik, J. A., Aikin, R. W., Bock, J. J., Dowell, C. D., Filippini, J. P., Golwala, S. R., Hristov, V. V., Lange, A. E., Nguyen, H. T., Orlando, A., Runyan, M., Staniszewski, Z.“...Society of Photo-optical Instrumentation Engineers (SPIE)...”
Published in SPIE Proceedings, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy V (2010)
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14by Kernasovskiy, S., Aikin, R. W., Bock, J. J., Brevik, J. A., Dowell, C. D., Filippini, J. P., Golwala, S. R., Hristov, V. V., Lueker, M., Nguyen, H. T., O'Brient, R., Runyan, M. C., Staniszewski, Z., Teply, G.“...Society of Photo-Optical Instrumentation Engineers (SPIE)...”
Published in SPIE Proceedings, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy VI (2012)
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15by Aikin, Randol W., Bock, J. J., Brevik, J. A., Dowell, C. D., Filippini, J. P., Golwala, S. R., Hristov, V. V., Lange, A. E., Nguyen, H. T., Orlando, A., Richter, S., Runyan, M. C., Teply, G. P.“...Society of Photo-optical Instrumentation Engineers (SPIE)...”
Published in SPIE Proceedings, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy V (2010)
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16by Sheehy, C. D., Aikin, R. W., Bock, J. J., Brevik, J. A., Dowell, C. D., Filippini, J. P., Golwala, S. R., Hristov, V. V., Lange, A. E., Lueker, M., Nguyen, H. T., Orlando, A., Runyan, M. C., Staniszewski, Z., Teply, G.“...Society of Photo-Optical Instrumentation Engineers (SPIE)...”
Published in SPIE Proceedings, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy V (2010)
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