ElectricRamsey Fringes
The raw data used in the preparation of 'Quantitative analysis of electrically detected Ramsey fringes in Phosphorus doped Silicon' P T Greenland, G Matmon, and B J Villis London Centre for Nanotechnology and Department of Physics and Astronomy, University College London, London WC1H 0AH,...
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| Format: | Dataset |
| Language: | unknown |
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2015
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| Online Access: | https://zenodo.org/record/30978 https://doi.org/10.5281/zenodo.30978 |
| Summary: | The raw data used in the preparation of 'Quantitative analysis of electrically detected Ramsey fringes in Phosphorus doped Silicon' P T Greenland, G Matmon, and B J Villis London Centre for Nanotechnology and Department of Physics and Astronomy, University College London, London WC1H 0AH, United Kingdom E T Bowyer, Juerong Li, and B N Murdin Advanced Technology Institute and SEPNet, University of Surrey, Guildford, Surrey GU2 7XH, United Kingdom A F G van der Meer and B Redlich Radboud University, Institute for Molecules and Materials, FELIX Laboratory, Toernooiveld 7c, 6525 ED Nijmegen, The Netherlands C R Pidgeon Institute of Photonics and Quantum Science, SUPA, Heriot-Watt University, Edinburgh EH14 4AS, UK G Aeppli Laboratory for Solid State Physics, ETH Zurich, Zurich, CH-8093, Switzerland, Institut de la Matiere Complexe, EPF Lausanne,br /> Lausanne, CH-1015, Switzerland, and Swiss Light Source,br /> Paul Scherrer Institut, Villigen PSI, CH-5232, Switzerlandbr /> (Dated: 13 July 2015)/p> |
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