EPMA data from tephra layer in IODP 374 Expedition Site U1524

Major-element data of single glass shards (raw data, normalized, and from U1524 tephra found in the U1524 from IODP Expedition 374 sites. Analyses were carried out with a JEOL JXA 8230 electron probe microanalyzer (EPMA) at Victoria University of Wellington using wavelength dispersive spectrometry t...

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Bibliographic Details
Main Authors: Di Roberto, Alessio, Scateni, Bianca, Di Vincenzo, Gianfranco, Petrelli, Maurizio, Fisauli, G, Barker, S J, Del Carlo, Paola, Colleoni, Florence, Kulhanek, Denise K, McKay, Robert M, de Santis, Laura, The IODP Expedition 374 Scientific Party
Format: Dataset
Language:English
Published: PANGAEA 2021
Subjects:
Online Access:https://doi.pangaea.de/10.1594/PANGAEA.933364
https://doi.org/10.1594/PANGAEA.933364
Description
Summary:Major-element data of single glass shards (raw data, normalized, and from U1524 tephra found in the U1524 from IODP Expedition 374 sites. Analyses were carried out with a JEOL JXA 8230 electron probe microanalyzer (EPMA) at Victoria University of Wellington using wavelength dispersive spectrometry techniques. Data includes calibrated international standards including ATHO-G, T1-G (Jochum et al., 2006), and VG-568 (USNM 72854) analyzed to monitor instrumental drift as well as the precision and accuracy of the analyses.