Testing of double-layer capacitors for high reliability applications

Double-Layer Capacitors (DLCs) have been used mainly for computer memory backup in consumer applications during the last ten years. Their high capacitance density, along with maintenance-free operation, makes them suited for these applications. In recent years users, mostly in military applications,...

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Bibliographic Details
Main Author: Clark, N.H.
Language:unknown
Published: 2008
Subjects:
42 ENGINEERING
36 MATERIALS SCIENCE
CAPACITORS
MECHANICAL TESTS
AGING
ALUMINIUM
CAPACITANCE
CARBON
IMPACT SHOCK
MECHANICAL VIBRATIONS
METALS
OXIDES
STRESSES
URETHANE
CARBAMATES
CARBONIC ACID DERIVATIVES
CARBOXYLIC ACID SALTS
CHALCOGENIDES
ELECTRICAL EQUIPMENT
ELECTRICAL PROPERTIES
ELEMENTS
EQUIPMENT
MATERIALS TESTING
NONMETALS
ORGANIC COMPOUNDS
ORGANIC NITROGEN COMPOUNDS
OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
TESTING
Pinnacle
Carbonic acid
Online Access:http://www.osti.gov/servlets/purl/6148891
https://www.osti.gov/biblio/6148891
Description
Summary:Double-Layer Capacitors (DLCs) have been used mainly for computer memory backup in consumer applications during the last ten years. Their high capacitance density, along with maintenance-free operation, makes them suited for these applications. In recent years users, mostly in military applications, have expressed interest in using DLCs in high reliability applications both for backup power and pulse power applications. To meet this need, developers have pursued technologies that use carbon and mixed metal oxides as the electrode material to produce high reliability double-layer capacitors. In this paper, a carbon-based DLC that was manufactured by Evans Company, and a mixed metal oxide (MMO) DLC by Pinnacle Research Inc. were evaluated. There is little published data on their reliability and aging characteristics. In addition, questions have arisen as to their environmental stability as a function of temperature, shock, vibration, and linear acceleration. The purpose of this paper is to review the available test data for both types of DLCs under these stress conditions. The data for this paper was generated by Sandia National Laboratories, General Electric Neutron Devices Department, Motorola Company, and Evans Company.

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