NGEE Arctic Leaf Spectral Absorptance, Barrow, Alaska, 2015-2016
Leaf level reflectance on each sample leaf was measured using a portable, full range (i.e. 0.35 to 2.5 microns) Spectra Vista Corporation (SVC) HR-1024i spectroradiometer, together with a leaf clip assembly with an internal, calibrated light source (SVC, Poughkeepsie, NY, USA). Each measurement was...
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| Language: | unknown |
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2019
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| Online Access: | http://www.osti.gov/servlets/purl/1482337 https://www.osti.gov/biblio/1482337 https://doi.org/10.5440/1482337 |
| Summary: | Leaf level reflectance on each sample leaf was measured using a portable, full range (i.e. 0.35 to 2.5 microns) Spectra Vista Corporation (SVC) HR-1024i spectroradiometer, together with a leaf clip assembly with an internal, calibrated light source (SVC, Poughkeepsie, NY, USA). Each measurement was referenced against a LabSphere Spectralon (R) standard (LabSphere, Inc., North Sutton, NH, USA) to calculate leaf reflectance from the ratio of target and standard calibrated radiance measurements for each leaf. For each leaf, we collected two to five measurements over the leaf adaxial surface to calculate an average, depending on the leaf size and morphology. Spectral discontinuities in the detector overlap areas were corrected using the SVC instrument software prior to sample averaging and other quality control steps, as described previously (Serbin et al., 2014) using the R-FieldSpectra package (https://github.com/serbinsh/R-FieldSpectra). Refer to Serbin et al (2017) for the complete spectral reflectance dataset. We then calculated leaf spectral absorptance using the measured leaf reflectance following the approach of Wu et al., (2018), based on the original method derived by Shiklomanov et al., (2016) using the PEcAnRTM package (https://github.com/PecanProject/pecan/tree/develop/modules/rtm). Dataset DOI https://doi.org/10.5440/1482337 |
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