Improved log sorting combining X-ray and 3D scanning : a preliminary study

Quality sorting of sawlogs is becoming more and more common. This is the result of increasing production of customer specific products in combination with high raw material prices. Today, log quality sorting is being based on either 3D or X-ray scanning techniques. Previous research has shown that s...

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Bibliographic Details
Main Authors: Skog, Johan, Oja, Johan
Format: Conference Object
Language:English
Published: Luleå tekniska universitet, Träteknologi 2007
Subjects:
Online Access:http://urn.kb.se/resolve?urn=urn:nbn:se:ltu:diva-29347
Description
Summary:Quality sorting of sawlogs is becoming more and more common. This is the result of increasing production of customer specific products in combination with high raw material prices. Today, log quality sorting is being based on either 3D or X-ray scanning techniques. Previous research has shown that sorting accuracy is improved when using multivariate models to combine variables from both 3D and X-ray scanners. There is however a potential of further improving the sorting if 3D and X-ray data are combined at an earlier stage; from the measured 3D shape a better estimate of the X-ray path lengths through the log may be found, thus enabling the calculation of a log density profile from the measured X-ray attenuation. The development and evaluation of such a technique is the topic of current research at SP Trätek and Luleå University of Technology in Skellefteå. Preliminary results show that the method is good at calculating large scale properties such as heartwood content and heartwood and sapwood densities. When looking for smaller geometric objects, e. g., knot whorls, extra care must be taken so that observational errors from the 3D scanner do not compromise the X-ray data. Software simulating industrial X-ray scanner data from CT-scanned logs has also been developed. A very good agreement was found between simulated data and actual data from an industrial installation. This underlines that such a simulation tool is very valuable when developing algorithms for industrial X-ray scanners. Godkänd; 2007; 20081203 (ysko)