Scanning electron microscopy and X-ray spectroscopy applied to mycelial phase of sporothrix schenckii
Scanning electron microscopy applied to the mycelial phase of Sporothrix schenckii shows a matted mycelium with conidia of a regular pattern. X-Ray microanalysis applied in energy dispersive spectroscopy and also in wavelength dispersive spectroscopy reveals the presence of several elements of Mende...
| Main Authors: | , |
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| Format: | Article in Journal/Newspaper |
| Language: | English |
| Published: |
Sociedade Brasileira de Medicina Tropical (SBMT)
1975
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| Subjects: | |
| Online Access: | https://doaj.org/article/7ef22f5ae31d49619b62def0a0246308 |
| Summary: | Scanning electron microscopy applied to the mycelial phase of Sporothrix schenckii shows a matted mycelium with conidia of a regular pattern. X-Ray microanalysis applied in energy dispersive spectroscopy and also in wavelength dispersive spectroscopy reveals the presence of several elements of Mendeleef's classification. Sporothrix schenckii foi estudado em microscopia eletrônica. Foram observados caracteres das hífas e dos esporos, vários elementos da classificação periódica foram postos em evidência graças à micro-análise a raios X. |
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