IODP Expedition 396 Color reflectance ...

Color reflectance data were measured on section halves using an integration sphere and a UV-VIS spectrophotometer mounted on the Section Half Multisensor Logger (SHMSL). Spectral counts are recorded in the range of 380 to 700 nm, covering the visible spectrum, and binned in ~2 nm bins. Spectral data...

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Bibliographic Details
Main Authors: Planke, Sverre, Berndt, Christian, Alvarez Zarikian, Carlos A., Agarwal, Amar, Andrews, Graham D.M., Betlem, Peter, Bhattacharya, Joyeeta, Brinkhuis, Henk, Chatterjee, Sayantani, Christopoulou, Marialena, Clementi, Vincent J., Ferré, Eric C., Filina, Irina Y., Frieling, Joost, Guo, Pengyuan, Harper, Dustin T., Jones, Morgan T., Lambart, Sarah, Longman, Jack, Millett, John, Mohn, Geoffroy, Nakaoka, Reina, Scherer, Reed P., Tegner, Christian, Varela, Natalia, Wang, Mengyuan, Xu, Weimu, Yager, Stacy L.
Format: Dataset
Language:unknown
Published: Zenodo 2023
Subjects:
Online Access:https://dx.doi.org/10.5281/zenodo.7806723
https://zenodo.org/record/7806723
Description
Summary:Color reflectance data were measured on section halves using an integration sphere and a UV-VIS spectrophotometer mounted on the Section Half Multisensor Logger (SHMSL). Spectral counts are recorded in the range of 380 to 700 nm, covering the visible spectrum, and binned in ~2 nm bins. Spectral data are reduced from spectra and recorded in tristimulus XYZ values, CieLAB L*a*b* values, and other units. ...