Noise-Resistant Deep Metric Learning with Probabilistic Instance Filtering
Noisy labels are commonly found in real-world data, which cause performance degradation of deep neural networks. Cleaning data manually is labour-intensive and time-consuming. Previous research mostly focuses on enhancing classification models against noisy labels, while the robustness of deep metri...
Main Authors: | , , , , , , , , |
---|---|
Format: | Article in Journal/Newspaper |
Language: | unknown |
Published: |
arXiv
2021
|
Subjects: | |
Online Access: | https://dx.doi.org/10.48550/arxiv.2108.01431 https://arxiv.org/abs/2108.01431 |
Summary: | Noisy labels are commonly found in real-world data, which cause performance degradation of deep neural networks. Cleaning data manually is labour-intensive and time-consuming. Previous research mostly focuses on enhancing classification models against noisy labels, while the robustness of deep metric learning (DML) against noisy labels remains less well-explored. In this paper, we bridge this important gap by proposing Probabilistic Ranking-based Instance Selection with Memory (PRISM) approach for DML. PRISM calculates the probability of a label being clean, and filters out potentially noisy samples. Specifically, we propose a novel method, namely the von Mises-Fisher Distribution Similarity (vMF-Sim), to calculate this probability by estimating a von Mises-Fisher (vMF) distribution for each data class. Compared with the existing average similarity method (AvgSim), vMF-Sim considers the variance of each class in addition to the average similarity. With such a design, the proposed approach can deal with challenging DML situations in which the majority of the samples are noisy. Extensive experiments on both synthetic and real-world noisy dataset show that the proposed approach achieves up to 8.37% higher Precision@1 compared with the best performing state-of-the-art baseline approaches, within reasonable training time. : Under review. Journal version of arXiv:2103.16047 |
---|