Radiation imaging with a new scintillator and a CMOS camera

• Published in: Journal of Instrumentation
• Main Authors: Kurosawa, S., Shoji, Y., Pejchal, J. (Jan), Yokota, Y., Yoshikawa, A.
• Format: Article in Journal/Newspaper
• Language: English
• Published: 2014
• Subjects: scintillators; scintillation and light emission processes; image processin; Orca
• Online Access: https://doi.org/10.1088/1748-0221/9/07/C07015; http://hdl.handle.net/11104/0256985

A new imaging system consisting of a high-sensitivity complementary metal-oxide semiconductor (CMOS) sensor, a microscope and a new scintillator, Ce-doped Gd3(Al,Ga) 5O12 (Ce:GAGG) grown by the Czochralski process, has been developed. The noise, the dark current and the sensitivity of the CMOS camera (ORCA-Flash4.0, Hamamatsu) was revised and compared to a conventional CMOS, whose sensitivity is at the same level as that of a charge coupled device (CCD) camera. Without the scintillator, this system had a good position resolution of 2.1 x 0.4 mm and we succeeded in obtaining the alpha-ray images sing 1-mm thick Ce:GAGG crystal. This system can be applied for example to high energy X-ray beam profile monitor, etc.