BIST-based diagnosis of FPGA interconnects

diagnostic approach for the programmable interconnect resources in Field Programmable Gate Arrays (FPGAs) that can be used for either on-line or off-line testing. The technique was originally intended for on-line diagnosis of faulty interconnect to support fault-tolerant applications. However, the t...

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Bibliographic Details
Main Authors: Charles Stroud, Jeremy Nall, Matthew Lashinsky
Other Authors: The Pennsylvania State University CiteSeerX Archives
Format: Text
Language:English
Published: 2002
Subjects:
Online Access:http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.117.2789
http://www.eng.auburn.edu/~strouce/class/bist/itc02.pdf
Description
Summary:diagnostic approach for the programmable interconnect resources in Field Programmable Gate Arrays (FPGAs) that can be used for either on-line or off-line testing. The technique was originally intended for on-line diagnosis of faulty interconnect to support fault-tolerant applications. However, the technique has been proven to be an excellent approach for off-line testing and diagnosis as well, providing high-resolution diagnostics with the ability to identify the faulty wire segment or programmable switch. We have implemented this BIST-based diagnostic approach on the ORCA series FPGA and present the results of testing and diagnosing known defective FPGAs. 1 1.