| Summary: | Progress Code: completed Statement: Refer to descriptions of XRF scanning for uses and limitations. e.g. Richter, T. O. et al., 2006. The Avaatech XRF scanner: technical description and applications to NE Atlantic sediments. In Rothwell, R.G. New techniques in sediment core analysis. Geological Society of London, Special Publication, 267, 39-50. Purpose Provides down core variations in major elements. Major element analyses of sediment in cores IN2017-V01-A005-PC01 and IN2017-V01-C012-PC05 collected using an Avaatech XRF scanner. Analyses taken every 50 mm. Piston cores were collected from the continental slope off the Sabrina Coast, seaward of the Totten Glacier. Cores were split, described and sampled for grain size, diatom assemblages and age dating. The archive half was then scammed using the Avaatech XRF scanner at Australian National University. The scanner works by analysing a spot every 5 cm down core for major elements using Xray Florescence to give an estimate of element abundance in counts per second. This can be converted into weight percent by analysing a calibration set of samples using other techniques (e.g. ICPMS) or to display the relative change in element abundances down core. The full suite of elements are obtained by 3 runs using different source energy levels. The files are labelled according to the energy level (in kv -kilovolts) of the source for 3 runs. Elements analysed in each run are: 10kv - Al, Si, P, S, Cl, K, Ca, Ti, Cr, Mn, Fe, Rh 30kv - Cu, Zn, Ga, Br, Rb, Sr, Y, Zr, Nb, Mo, Pb, Bi 50kv - Ag, Cd, Sn, Te, Ba.
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