SSCS-Green Mountain Organizes 17th IEEE North Atlantic Test Workshop, IEEE NATW Special Session on Solid-State Circuits & System Test Held on 14–16 May, 2008

Bibliographic Details
Published in:IEEE Solid-State Circuits Newsletter
Main Author: Nsame, Pascal
Format: Article in Journal/Newspaper
Language:unknown
Published: Institute of Electrical and Electronics Engineers (IEEE) 2008
Subjects:
Online Access:http://dx.doi.org/10.1109/n-ssc.2008.4785801
http://xplorestaging.ieee.org/ielx5/4563671/4785770/04785801.pdf?arnumber=4785801
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