Application of electrical resistivity tomography in investigating depth of permafrost base and permafrost structure in Tibetan Plateau

• Published in: Cold Regions Science and Technology
• Main Authors: You, Yanhui, Yu, Qihao, Pan, Xicai, Wang, Xinbin, Guo, Lei
• Format: Article in Journal/Newspaper
• Language: English
• Published: Elsevier BV 2013
• Subjects: General Earth and Planetary Sciences; Geotechnical Engineering and Engineering Geology; permafrost
• Online Access: http://dx.doi.org/10.1016/j.coldregions.2012.11.004; https://api.elsevier.com/content/article/PII:S0165232X1200225X?httpAccept=text/xml; https://api.elsevier.com/content/article/PII:S0165232X1200225X?httpAccept=text/plain