Determination of a-Axis Orientations of Polycrystalline Ice
Abstract Two new methods have been devised for measurement of crystallographic lattice orientations of individual crystals in polycrystalline ice. The first uses edge-length ratios of etch pits. The second uses a combination of optical measurement on a thin section and etch-pit technique. Although t...
| Published in: | Journal of Glaciology |
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| Main Author: | |
| Format: | Article in Journal/Newspaper |
| Language: | English |
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Cambridge University Press (CUP)
1979
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| Subjects: | |
| Online Access: | http://dx.doi.org/10.1017/s0022143000014143 https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S0022143000014143 |
| Summary: | Abstract Two new methods have been devised for measurement of crystallographic lattice orientations of individual crystals in polycrystalline ice. The first uses edge-length ratios of etch pits. The second uses a combination of optical measurement on a thin section and etch-pit technique. Although the second method does not work for crystals with their c -axis oriented parallel to the thin section, it is much simpler and more practical than the first method. When used on polycrystalline glacier ice, this method gave the three a -axes orientations as well as c -axis orientation for each crystal with an accuracy of 5°. |
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