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1by Abarr, Q., Allison, P., Yebra, J. Ammerman, Alvarez-Muñiz, J., Beatty, J. J., Besson, D. Z., Chen, P., Chen, Y., Clem, J. M., Connolly, A., Cremonesi, L., Deaconu, C., Flaherty, J., Frikken, D., Gorham, P. W., Hast, C., Hornhuber, C., Huang, J. J., Hughes, K., Hynous, A., Ku, Y., Kuo, C. -Y., Liu, T. C., Martin, Z., Miki, C., Nam, J., Nichol, R. J., Nishimura, K., Novikov, A., Nozdrina, A., Oberla, E., Prohira, S., Prechelt, R., Rauch, B. F., Roberts, J. M., Romero-Wolf, A., Russell, J. W., Seckel, D., Shiao, J., Smith, D., Southall, D., Varner, G. S., Vieregg, A. G., Wang, S. -H., Wang, Y. -H., Wissel, S. A., Xie, C., Young, R., Zas, E., Zeolla, A.Get access
Published 2020
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Article in Journal/Newspaper -
2by Abarr, Q., Allison, P., Yebra, J. Ammerman, Alvarez-Muñiz, J., Beatty, J. J., Besson, D. Z., Chen, P., Chen, Y., Clem, J. M., Connolly, A., Cremonesi, L., Deaconu, C., Flaherty, J., Frikken, D., Gorham, P. W., Hast, C., Hornhuber, C., Huang, J. J., Hughes, K., Hynous, A., Ku, Y., Kuo, C. -Y., Liu, T. C., Martin, Z., Miki, C., Nam, J., Nichol, R. J., Nishimura, K., Novikov, A., Nozdrina, A., Oberla, E., Prohira, S., Prechelt, R., Rauch, B. F., Roberts, J. M., Romero-Wolf, A., Russell, J. W., Seckel, D., Shiao, J., Smith, D., Southall, D., Varner, G. S., Vieregg, A. G., Wang, S. -H., Wang, Y. -H., Wissel, S. A., Xie, C., Young, R., Zas, E., Zeolla, A.Get access
Published in Journal of Instrumentation (2020)
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