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Brian Befano
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Deep Metric Learning for Cervical Image Classification
by
Anabik Pal
,
Zhiyun Xue
,
Brian
Befano
,
Ana Cecilia Rodriguez
,
L. Rodney Long
,
Mark Schiffman
,
Sameer Antani
Published in
IEEE Access
(2021)
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Related Subjects
Automated cervical visual examination
Electrical engineering. Electronics. Nuclear engineering
TK1-9971
cervical cancer
deep metric learning
siamese network
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