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1by Sandven, S., Hamre, T., Kudryavtsev, V. N., Akimov, D., Bobylev, L., Lavrenov, I. V., Stanovoy, V., Ermakov, A., Feoktisov, A., Lyushvin, P. V., Malinovsky, V. V., Agarkov, V., Matvienko, S.Get access
Published 2006
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3by Burnett, T., Iwai, J., Lord, J.J., Strausz, S., Wilkes, R.J. (Washington Univ., Seattle, WA (USA)), Dake, S., Oda, H. (Kobe Univ. (Japan)), Miyamura, O. (Osaka Univ. (Japan)), Fuki, M. (Matsusho Gakuen Junior Coll., Matsumoto (Japan)), Jones, W.V. (National Aeronautics and Space Administration, Washington, DC (USA)), Gregory, J., Hayashi, T., Takahashi, U. (Alabama Univ., Huntsville, AL (USA)), TominagaGet access
Published 1989
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5by Winder, Tom, Bacon, Conor, Smith, Jonathan D., Hudson, Thomas S., Drew, Julian, White, Robert S.Get access
Published 2021
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6by Winder, Tom, Bacon, Conor, Smith, Jonathan D., Hudson, Thomas S., Drew, Julian, White, Robert S.Get access
Published 2021
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12by Carrere, Loren, Mertz, Francoise, Dorandeu, Joel, Quilfen, Yves, Patoux, JeromeGet access
Published in Sensors (2009)
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