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1by Shaw, E. C., Ade, P.A.R., Akers, S., Amiri, M., Austermann, Jason E., Beall, James A., Becker, D.T., Benton, S.J., Bergman, A. S., Bock, J. J., Bond, J.R., Bryan, S.A., Chiang, H.C., Contaldi, C.R., Domagalski, R.S., Doré, O., Duff, S. M., Duivenvoorden, A.J., Eriksen, H.K., Farhang, M., Filippini, J. P., Fissel, L.M., Fraisse, A.A., Freese, K., Galloway, M., Gambrel, A. E., Gandilo, N.N., Ganga, K., Grigorian, A., Gualtieri, R, Gudmundsson, J.E., Halpern, M., Hartley, J., Hasselfield, M., Hilton, G., Holmes, W., Hristov, V. V., Huang, Z., Hubmayr, Johannes, Irwin, K.D., Jones, W.C., Kahn, A., Kuo, C.L., Kermish, Z.D., Lennox, A., Leung, J. S.-Y., Megerian, K., Reintsema, C., Li, S., Mason, P. V., Runyan, M. C., Moncelsi, L., Morford, T. A., Nagy, J.M., Nie, R., Mocanu, L. M., Padilla, I.L., Netterfield, C. B., Osherson, B., Rahlin, A.S., Redmond, S., Turner, A. D., Romualdez, L.J., Nolta, M., Ruhl, J.E., Shariff, J.A., Shiu, C., Soler, J.D., Song, X., Trangsrud, A., Thommesen, H., Tucker, C, Tucker, R. S., Ullom, Joel, van der List, J.F., Van Lanen, Jeff, Vissers, M. R., Weber, A. C., Wen, S., Wehus, I.K., Wiebe, D.V., Young, E.Y.“...Society of Photo-Optical Instrumentation Engineers (SPIE)...”
Published in Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy X (2020)
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