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Electromagnetic Modeling in Near-Field Scanning Microwave Microscopy Highlightin...
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Boyaval, Christophe
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Brillard, Charlene
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Clement, Nicolas
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Dambrine, Gilles
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Deresmes, D.
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Eliet, Sophie
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Haddadi, Kamel
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Haenssler, Olaf, C
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Polovodov, Petr
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[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
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[SPI]Engineering Sciences [physics]
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electromagnetic modeling
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finite element method (FEM)
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near-field scanning microwave microscopy (NSMM)
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scanning electron microscope (SEM)
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vector network analyzer (VNA)
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HAL IMT Nord Europe - Université de Lille
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