Comparison of simulated 2D temperature profiles with time-lapse electrical resistivity data at the Schilthorn Crest, Switzerland

• Main Authors: Noetzli, J, Gruber, S, Hilbich, C, Hoelzle, M, Hauck, C, Krauer, M
• Format: Conference Object
• Language: English
• Published: 2008
• Subjects: Institute of Geography; 910 Geography & travel; Crest The; permafrost
• Online Access: https://www.zora.uzh.ch/id/eprint/3096/; https://www.zora.uzh.ch/id/eprint/3096/9/Noetzli_2D_Temperature_2008_.pdf; https://doi.org/10.5167/uzh-3096

The Schilthorn Crest in the Bernese Alps, Switzerland, is a prominent permafrost research site. Topographic and transient effects influence the temperature field below the east-west oriented crest. Measured T(z)-profiles in boreholes, however, do not provide sufficient information for a comprehensiv...