Testing of double-layer capacitors for high reliability applications

• Main Author: Clark, N.H.
• Other Authors: United States. Department of Energy.
• Format: Article in Journal/Newspaper
• Language: English
• Published: Sandia National Laboratories 1991
• Subjects: Elements; Impact Shock; 36 Materials Science; Organic Compounds; Testing 426000* > Engineering > Components; Electron Devices & Circuits > (1990-); Oxides; Carbon; Mechanical Vibrations; Electrical Properties; Stresses; Chalcogenides; Electrical Equipment; Capacitors; Materials Testing; Urethane; 360103 > Metals & Alloys > Mechanical Properties; Physical Properties; Carboxylic Acid Salts; Aluminium; Metals; 42 Engineering; Mechanical Tests; 360104 > Metals & Alloys > Physical Properties; Oxygen Compounds; Aging; Carbonic Acid Derivatives; Organic Nitrogen Compounds; Nonmetals; Equipment; Capacitance; Carbamates; Pinnacle; Carbonic acid
• Online Access: https://digital.library.unt.edu/ark:/67531/metadc1114760/

Double-Layer Capacitors (DLCs) have been used mainly for computer memory backup in consumer applications during the last ten years. Their high capacitance density, along with maintenance-free operation, makes them suited for these applications. In recent years users, mostly in military applications, have expressed interest in using DLCs in high reliability applications both for backup power and pulse power applications. To meet this need, developers have pursued technologies that use carbon and mixed metal oxides as the electrode material to produce high reliability double-layer capacitors. In this paper, a carbon-based DLC that was manufactured by Evans Company, and a mixed metal oxide (MMO) DLC by Pinnacle Research Inc. were evaluated. There is little published data on their reliability and aging characteristics. In addition, questions have arisen as to their environmental stability as a function of temperature, shock, vibration, and linear acceleration. The purpose of this paper is to review the available test data for both types of DLCs under these stress conditions. The data for this paper was generated by Sandia National Laboratories, General Electric Neutron Devices Department, Motorola Company, and Evans Company.