APA (7th ed.) Citation

Larue, F., Picard, G., Arnaud, L., Ollivier, I., Delcourt, C., Lamare, M., . . . Dumont, M. (2020). Snow albedo sensitivity to macroscopic surface roughness using a new ray-tracing model. The Cryosphere, 14(5), 1651.

Chicago Style (17th ed.) Citation

Larue, F., G. Picard, L. Arnaud, I. Ollivier, C. Delcourt, M. Lamare, F. Tuzet, J. Revuelto, and M. Dumont. "Snow Albedo Sensitivity to Macroscopic Surface Roughness Using a New Ray-tracing Model." The Cryosphere 14, no. 5 (2020): 1651.

MLA (9th ed.) Citation

Larue, F., et al. "Snow Albedo Sensitivity to Macroscopic Surface Roughness Using a New Ray-tracing Model." The Cryosphere, vol. 14, no. 5, 2020, p. 1651.