Tuning SPT-3G Transition-Edge-Sensor Electrical Properties with a Four-Layer Ti–Au–Ti–Au Thin-Film Stack

• Published in: Journal of Low Temperature Physics
• Main Authors: Carter, F. W., Ade, P. A. R., Ahmed, Z., Anderson, A. J., Austermann, J. E., Avva, J. S., Thakur, R. Basu, Bender, A. N., Benson, B. A., Carlstrom, J. E., Cecil, T., Chang, C. L., Cliche, J. F., Cukierman, A., Denison, E. V., de Haan, T., Ding, J., Divan, R., Dobbs, M. A., Dutcher, D., Everett, W., Foster, A., Gannon, R. N., Gilbert, A., Groh, J. C., Halverson, N. W., Harke-Hosemann, A. H., Harrington, N. L., Henning, J. W., Hilton, G. C., Holzapfel, W. L., Huang, N., Irwin, K. D., Jeong, O. B., Jonas, M., Khaire, T., Kofman, A. M., Korman, M., Kubik, D., Kuhlmann, S., Kuo, C. L., Kutepova, V., Lee, A. T., Lowitz, A. E., Meyer, S. S., Michalik, D., Miller, C. S., Montgomery, J., Nadolski, A., Natoli, T., Nguyen, H., Noble, G. I., Novosad, V., Padin, S., Pan, Z., Pearson, J., Posada, C. M., Rahlin, A., Ruhl, J. E., Saunders, L. J., Sayre, J. T., Shirley, I., Shirokoff, E., Smecher, G., Sobrin, J. A., Stan, L., Stark, A. A., Story, K. T., Suzuki, A., Tang, Q. Y., Thompson, K. L., Tucker, C., Vale, L. R., Vanderlinde, K., Vieira, J. D., Wang, G., Whitehorn, N., Yefremenko, V., Yoon, K. W., Young, M. R.
• Language: unknown
• Published: 2022
• Subjects: 71 CLASSICAL AND QUANTUM MECHANICS; GENERAL PHYSICS; Austral; South Pole; South pole
• Online Access: http://www.osti.gov/servlets/purl/1490488; https://www.osti.gov/biblio/1490488; https://doi.org/10.1007/s10909-018-1910-7

We have developed superconducting Ti transition-edge sensors with Au protection layers on the top and bottom for the South Pole Telescope’s third-generation receiver (a cosmic microwave background polarimeter, due to be upgraded this austral summer of 2017/2018). The base Au layer (deposited on a thin Ti glue layer) isolates the Ti from any substrate effects; the top Au layer protects the Ti from oxidation during processing and subsequent use of the sensors. We control the transition temperature and normal resistance of the sensors by varying the sensor width and the relative thicknesses of the Ti and Au layers. The transition temperature is roughly six times more sensitive to the thickness of the base Au layer than to that of the top Au layer. The normal resistance is inversely proportional to sensor width for any given film configuration. For widths greater than five micrometers, the critical temperature is independent of width.