DML-PL: deep metric learning based pseudo-labeling framework for class imbalanced semi-supervised learning

Traditional class imbalanced learning algorithms require training data to be labeled, whereas semi-supervised learning algorithms assume that the class distribution is balanced. However, class imbalance and insufficient labeled data problems often coexist in practical real-world applications. Curren...

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Published in:Information Sciences
Main Authors: Yan, Mi, Hui, Siu Cheung, Li, Ning
Other Authors: School of Computer Science and Engineering
Format: Article in Journal/Newspaper
Language:English
Published: 2023
Subjects:
DML
Online Access:https://hdl.handle.net/10356/170840
https://doi.org/10.1016/j.ins.2023.01.074
id ftnanyangtu:oai:dr.ntu.edu.sg:10356/170840
record_format openpolar
spelling ftnanyangtu:oai:dr.ntu.edu.sg:10356/170840 2023-11-05T03:41:36+01:00 DML-PL: deep metric learning based pseudo-labeling framework for class imbalanced semi-supervised learning Yan, Mi Hui, Siu Cheung Li, Ning School of Computer Science and Engineering 2023 https://hdl.handle.net/10356/170840 https://doi.org/10.1016/j.ins.2023.01.074 en eng Information Sciences Yan, M., Hui, S. C. & Li, N. (2023). DML-PL: deep metric learning based pseudo-labeling framework for class imbalanced semi-supervised learning. Information Sciences, 626, 641-657. https://dx.doi.org/10.1016/j.ins.2023.01.074 0020-0255 https://hdl.handle.net/10356/170840 doi:10.1016/j.ins.2023.01.074 2-s2.0-85149786935 626 641 657 © 2023 Elsevier Inc. All rights reserved. Engineering::Computer science and engineering Class Imbalanced Classification Semi-Supervised Learning Journal Article 2023 ftnanyangtu https://doi.org/10.1016/j.ins.2023.01.074 2023-10-06T00:22:46Z Traditional class imbalanced learning algorithms require training data to be labeled, whereas semi-supervised learning algorithms assume that the class distribution is balanced. However, class imbalance and insufficient labeled data problems often coexist in practical real-world applications. Currently, most existing class-imbalanced semi-supervised learning methods tackle these two problems separately, resulting in the trained model biased towards majority classes that have more data samples. In this study, we propose a deep metric learning based pseudo-labeling (DML-PL) framework that tackles both problems simultaneously for class-imbalanced semi-supervised learning. The proposed DML-PL framework comprises three modules: Deep Metric Learning, Pseudo-Labeling and Network Fine-tuning. An iterative self-training strategy is used to train the model multiple times. For each time of training, Deep Metric Learning trains a deep metric network to learn compact feature representations of labeled and unlabeled data. Pseudo-Labeling then generates reliable pseudo-labels for unlabeled data through labeled data clustering with nearest neighbors selection. Finally, Network Fine-tuning fine-tunes the deep metric network to generate better pseudo-labels in the subsequent training. The training ends when all the unlabeled data are pseudo-labeled. The proposed framework achieved state-of-the-art performance on the long-tailed CIFAR-10, CIFAR-100, and ImageNet127 benchmark datasets compared with baseline models. This study is supported by National Natural Science Foundation of China (62273230) and China Scholarship Council (No.202006230225) Article in Journal/Newspaper DML DR-NTU (Digital Repository at Nanyang Technological University, Singapore) Information Sciences 626 641 657
institution Open Polar
collection DR-NTU (Digital Repository at Nanyang Technological University, Singapore)
op_collection_id ftnanyangtu
language English
topic Engineering::Computer science and engineering
Class Imbalanced Classification
Semi-Supervised Learning
spellingShingle Engineering::Computer science and engineering
Class Imbalanced Classification
Semi-Supervised Learning
Yan, Mi
Hui, Siu Cheung
Li, Ning
DML-PL: deep metric learning based pseudo-labeling framework for class imbalanced semi-supervised learning
topic_facet Engineering::Computer science and engineering
Class Imbalanced Classification
Semi-Supervised Learning
description Traditional class imbalanced learning algorithms require training data to be labeled, whereas semi-supervised learning algorithms assume that the class distribution is balanced. However, class imbalance and insufficient labeled data problems often coexist in practical real-world applications. Currently, most existing class-imbalanced semi-supervised learning methods tackle these two problems separately, resulting in the trained model biased towards majority classes that have more data samples. In this study, we propose a deep metric learning based pseudo-labeling (DML-PL) framework that tackles both problems simultaneously for class-imbalanced semi-supervised learning. The proposed DML-PL framework comprises three modules: Deep Metric Learning, Pseudo-Labeling and Network Fine-tuning. An iterative self-training strategy is used to train the model multiple times. For each time of training, Deep Metric Learning trains a deep metric network to learn compact feature representations of labeled and unlabeled data. Pseudo-Labeling then generates reliable pseudo-labels for unlabeled data through labeled data clustering with nearest neighbors selection. Finally, Network Fine-tuning fine-tunes the deep metric network to generate better pseudo-labels in the subsequent training. The training ends when all the unlabeled data are pseudo-labeled. The proposed framework achieved state-of-the-art performance on the long-tailed CIFAR-10, CIFAR-100, and ImageNet127 benchmark datasets compared with baseline models. This study is supported by National Natural Science Foundation of China (62273230) and China Scholarship Council (No.202006230225)
author2 School of Computer Science and Engineering
format Article in Journal/Newspaper
author Yan, Mi
Hui, Siu Cheung
Li, Ning
author_facet Yan, Mi
Hui, Siu Cheung
Li, Ning
author_sort Yan, Mi
title DML-PL: deep metric learning based pseudo-labeling framework for class imbalanced semi-supervised learning
title_short DML-PL: deep metric learning based pseudo-labeling framework for class imbalanced semi-supervised learning
title_full DML-PL: deep metric learning based pseudo-labeling framework for class imbalanced semi-supervised learning
title_fullStr DML-PL: deep metric learning based pseudo-labeling framework for class imbalanced semi-supervised learning
title_full_unstemmed DML-PL: deep metric learning based pseudo-labeling framework for class imbalanced semi-supervised learning
title_sort dml-pl: deep metric learning based pseudo-labeling framework for class imbalanced semi-supervised learning
publishDate 2023
url https://hdl.handle.net/10356/170840
https://doi.org/10.1016/j.ins.2023.01.074
genre DML
genre_facet DML
op_relation Information Sciences
Yan, M., Hui, S. C. & Li, N. (2023). DML-PL: deep metric learning based pseudo-labeling framework for class imbalanced semi-supervised learning. Information Sciences, 626, 641-657. https://dx.doi.org/10.1016/j.ins.2023.01.074
0020-0255
https://hdl.handle.net/10356/170840
doi:10.1016/j.ins.2023.01.074
2-s2.0-85149786935
626
641
657
op_rights © 2023 Elsevier Inc. All rights reserved.
op_doi https://doi.org/10.1016/j.ins.2023.01.074
container_title Information Sciences
container_volume 626
container_start_page 641
op_container_end_page 657
_version_ 1781698040858411008