Analysis of QualitySpec Trek Reflectance from Vertical Profiles of Taiga Snowpack

Snow microstructure is an important factor for microwave and optical remote sensing of snow. One parameter used to describe it is the specific surface area (SSA), which is defined as the surface-area-to-mass ratio of snow grains. Reflectance at near infrared (NIR) and short-wave infrared (SWIR) wave...

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Bibliographic Details
Published in:Geosciences
Main Authors: Leena Leppänen, Anna Kontu
Format: Text
Language:English
Published: Multidisciplinary Digital Publishing Institute 2018
Subjects:
Online Access:https://doi.org/10.3390/geosciences8110404