Distance Metric Learning for Content Identification

This paper considers a distance metric learning (DML) algorithm for a fingerprinting system, which identifies a query content by finding the fingerprint in the database (DB) that measures the shortest distance to the query fingerprint. For a given training set consisting of original and distorted fi...

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Bibliographic Details
Published in:IEEE Transactions on Information Forensics and Security
Main Authors: Jang, D, Yoo, CD Yoo, Chang Dong, Kalker, T
Format: Article in Journal/Newspaper
Language:English
Published: IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC 2010
Subjects:
DML
Online Access:http://hdl.handle.net/10203/95203
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=000284360000029&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=395d0a69a77a4892902e43d8987013d5
https://doi.org/10.1109/TIFS.2010.2064769
id ftkoasas:oai:koasas.kaist.ac.kr:10203/95203
record_format openpolar
spelling ftkoasas:oai:koasas.kaist.ac.kr:10203/95203 2023-05-15T16:01:32+02:00 Distance Metric Learning for Content Identification Jang, D Yoo, CD Yoo, Chang Dong Kalker, T 201012 http://hdl.handle.net/10203/95203 http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=000284360000029&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=395d0a69a77a4892902e43d8987013d5 https://doi.org/10.1109/TIFS.2010.2064769 ENG eng IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC ARTICLE A 2010 ftkoasas https://doi.org/10.1109/TIFS.2010.2064769 2013-12-15T18:30:08Z This paper considers a distance metric learning (DML) algorithm for a fingerprinting system, which identifies a query content by finding the fingerprint in the database (DB) that measures the shortest distance to the query fingerprint. For a given training set consisting of original and distorted fingerprints, a distance metric equivalent to the l(p) norm of the difference of two linearly projected fingerprints is learned by minimizing the false-positive rate (probability of perceptually dissimilar content to be identified as being similar) for a given false-negative rate (probability of perceptually similar content to be identified as being dissimilar). The learned metric can perform better than the often used l(p) distance and improve the robustness against a set of unexpected distortions. In the experiments, the distance metric learned by the proposed algorithm performed better than those metrics learned by well-known DML algorithms for classification. 전기및전자공학과 Article in Journal/Newspaper DML Korea Advanced Institute of Science and Technology: KOASAS - KAIST Open Access Self-Archiving System IEEE Transactions on Information Forensics and Security 5 4 932 944
institution Open Polar
collection Korea Advanced Institute of Science and Technology: KOASAS - KAIST Open Access Self-Archiving System
op_collection_id ftkoasas
language English
description This paper considers a distance metric learning (DML) algorithm for a fingerprinting system, which identifies a query content by finding the fingerprint in the database (DB) that measures the shortest distance to the query fingerprint. For a given training set consisting of original and distorted fingerprints, a distance metric equivalent to the l(p) norm of the difference of two linearly projected fingerprints is learned by minimizing the false-positive rate (probability of perceptually dissimilar content to be identified as being similar) for a given false-negative rate (probability of perceptually similar content to be identified as being dissimilar). The learned metric can perform better than the often used l(p) distance and improve the robustness against a set of unexpected distortions. In the experiments, the distance metric learned by the proposed algorithm performed better than those metrics learned by well-known DML algorithms for classification. 전기및전자공학과
format Article in Journal/Newspaper
author Jang, D
Yoo, CD Yoo, Chang Dong
Kalker, T
spellingShingle Jang, D
Yoo, CD Yoo, Chang Dong
Kalker, T
Distance Metric Learning for Content Identification
author_facet Jang, D
Yoo, CD Yoo, Chang Dong
Kalker, T
author_sort Jang, D
title Distance Metric Learning for Content Identification
title_short Distance Metric Learning for Content Identification
title_full Distance Metric Learning for Content Identification
title_fullStr Distance Metric Learning for Content Identification
title_full_unstemmed Distance Metric Learning for Content Identification
title_sort distance metric learning for content identification
publisher IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
publishDate 2010
url http://hdl.handle.net/10203/95203
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=000284360000029&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=395d0a69a77a4892902e43d8987013d5
https://doi.org/10.1109/TIFS.2010.2064769
genre DML
genre_facet DML
op_doi https://doi.org/10.1109/TIFS.2010.2064769
container_title IEEE Transactions on Information Forensics and Security
container_volume 5
container_issue 4
container_start_page 932
op_container_end_page 944
_version_ 1766397352216625152