Fully automated analysis of grain chemistry, size and morphology by CCSEM: examples from cement produc tion and diamond exploration

Computer-controlled scanning electron microscopy (CCSEM) combines the advantages of energy dispersive X-ray spectrometry (EDX) with those of digital image analysis of back-scattered electron (BSE) micrographs. CCSEM analysis of a wide range of geological or non-geological materials has been introduc...

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Bibliographic Details
Published in:Geological Survey of Denmark and Greenland (GEUS) Bulletin
Main Authors: Keulen, Nynke, Frei, Dirk, Bernstein, Stefan, Hutchison, Mark T., Knudsen, Christian, Jensen, Lucas
Format: Article in Journal/Newspaper
Language:English
Published: Geological Survey of Denmark and Greenland (GEUS) 2008
Subjects:
Greenland
Knudsen
Huffman
Huggins
Online Access:https://geusbulletin.org/index.php/geusb/article/view/5053
https://doi.org/10.34194/geusb.v15.5053

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