APA (7th ed.) Citation

Larue, F., Picard, G., Arnaud, L., Ollivier, I., Delcourt, C., Lamare, M., . . . ANR-16-CE01-0006,EBONI,Dépot, d. e. i. d. i. a. d. l. m. n. (2020). Snow albedo sensitivity to macroscopic surface roughness using a new ray-tracing model. The Cryosphere, 14(5), 1651.

Chicago Style (17th ed.) Citation

Larue, Fanny, et al. "Snow Albedo Sensitivity to Macroscopic Surface Roughness Using a New Ray-tracing Model." The Cryosphere 14, no. 5 (2020): 1651.

MLA (9th ed.) Citation

Larue, Fanny, et al. "Snow Albedo Sensitivity to Macroscopic Surface Roughness Using a New Ray-tracing Model." The Cryosphere, vol. 14, no. 5, 2020, p. 1651.