APA (7th ed.) Citation

You, J., Jiang, K., & Lee, J. (2022). Deep Metric Learning-Based Strawberry Disease Detection With Unknowns. Frontiers in Plant Science, 13, .

Chicago Style (17th ed.) Citation

You, Jie, Kan Jiang, and Joonwhoan Lee. "Deep Metric Learning-Based Strawberry Disease Detection With Unknowns." Frontiers in Plant Science 13 (2022).

MLA (9th ed.) Citation

You, Jie, et al. "Deep Metric Learning-Based Strawberry Disease Detection With Unknowns." Frontiers in Plant Science, vol. 13, 2022.