Continuous-wave terahertz system based on a dual-mode laser for real-time non-contact measurement of thickness and conductivity

• Main Authors: Kiwon Moon, Namje Kim, Jun-Hwan Shin, Young-Jong Yoon, Sang-Pil Han, Park, Kyung Hyun
• Format: Article in Journal/Newspaper
• Language: unknown
• Published: Figshare 2014
• Subjects: Biochemistry; Space Science; 29999 Physical Sciences not elsewhere classified; FOS Physical sciences; Medicine; Biotechnology; 39999 Chemical Sciences not elsewhere classified; FOS Chemical sciences; Ecology; FOS Biological sciences; Sociology; FOS Sociology; 69999 Biological Sciences not elsewhere classified; Science Policy; DML
• Online Access: https://dx.doi.org/10.6084/m9.figshare.c.3765284.v1; https://figshare.com/collections/Continuous-wave_terahertz_system_based_on_a_dual-mode_laser_for_real-time_non-contact_measurement_of_thickness_and_conductivity/3765284/1

Terahertz (THz) waves have been exploited for the non-contact measurements of thickness and refractive index, which has enormous industrial applicability. In this work, we demonstrate a 1.3-μm dual-mode laser (DML)-based continuous-wave THz system for the real-time measurement of a commercial indium-tin-oxide (ITO)-coated glass. The system is compact, cost-effective, and capable of performing broadband measurement within a second at the setting resolution of 1 GHz. The thickness of the glass and the sheet conductivity of the ITO film were successfully measured, and the measurements agree well with those of broadband pulse-based time domain spectroscopy and Hall measurement results.