NGEE Arctic Leaf Spectral Absorptance, Utqiagvik (Barrow), Alaska, 2015-2016 ...
Leaf level reflectance on each sample leaf was measured using a portable, full range (i.e. 0.35 to 2.5 microns) Spectra Vista Corporation (SVC) HR-1024i spectroradiometer, together with a leaf clip assembly with an internal, calibrated light source (SVC, Poughkeepsie, NY, USA). Each measurement was...
| Main Author: | |
|---|---|
| Format: | Dataset |
| Language: | English |
| Published: |
Next Generation Ecosystems Experiment - Arctic, Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (US); NGEE Arctic, Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
2019
|
| Subjects: | |
| Online Access: | https://dx.doi.org/10.5440/1482337 https://www.osti.gov/servlets/purl/1482337/ |
| Summary: | Leaf level reflectance on each sample leaf was measured using a portable, full range (i.e. 0.35 to 2.5 microns) Spectra Vista Corporation (SVC) HR-1024i spectroradiometer, together with a leaf clip assembly with an internal, calibrated light source (SVC, Poughkeepsie, NY, USA). Each measurement was referenced against a LabSphere Spectralon (R) standard (LabSphere, Inc., North Sutton, NH, USA) to calculate leaf reflectance from the ratio of target and standard calibrated radiance measurements for each leaf. For each leaf, we collected two to five measurements over the leaf adaxial surface to calculate an average, depending on the leaf size and morphology. Spectral discontinuities in the detector overlap areas were corrected using the SVC instrument software prior to sample averaging and other quality control steps, as described previously (Serbin et al., 2014) using the R-FieldSpectra package (https://github.com/serbinsh/R-FieldSpectra). Refer to Serbin et al (2017) for the complete spectral reflectance ... |
|---|