IODP Expedition 396 X-ray fluorescence (XRF) ...

Elemental peak intensities in section halves were measured by an Avaatech X-ray fluorescence (XRF) Core Scanner postexpedition. Each measurement position may be measured at multiple XRF conditions in order to excite and measure specific ranges of elements (e.g., 10 kV and no filter for light element...

Full description

Bibliographic Details
Main Authors: Planke, Sverre, Berndt, Christian, Alvarez Zarikian, Carlos A., Agarwal, Amar, Andrews, Graham D.M., Betlem, Peter, Bhattacharya, Joyeeta, Brinkhuis, Henk, Chatterjee, Sayantani, Christopoulou, Marialena, Clementi, Vincent J., Ferré, Eric C., Filina, Irina Y., Frieling, Joost, Guo, Pengyuan, Harper, Dustin T., Jones, Morgan T., Lambart, Sarah, Longman, Jack, Millett, John, Mohn, Geoffroy, Nakaoka, Reina, Scherer, Reed P., Tegner, Christian, Varela, Natalia, Wang, Mengyuan, Xu, Weimu, Yager, Stacy L.
Format: Dataset
Language:unknown
Published: Zenodo 2023
Subjects:
Online Access:https://dx.doi.org/10.5281/zenodo.7850795
https://zenodo.org/record/7850795
Description
Summary:Elemental peak intensities in section halves were measured by an Avaatech X-ray fluorescence (XRF) Core Scanner postexpedition. Each measurement position may be measured at multiple XRF conditions in order to excite and measure specific ranges of elements (e.g., 10 kV and no filter for light elements). Peak intensity changes (concentrations not provided) are then used to help recognize and define major chemostratigraphic units without the need for destructive sampling. Data are presented in comma-delimited (CSV) files by section and by energy/instrumental conditions. ...