Electricramsey Fringes
The raw data used in the preparation of 'Quantitative analysis of electrically detected Ramsey fringes in Phosphorus doped Silicon' P T Greenland, G Matmon, and B J Villis London Centre for Nanotechnology and Department of Physics and Astronomy, University College London, London WC1H 0AH,...
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| Format: | Dataset |
| Language: | unknown |
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Zenodo
2015
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| Online Access: | https://dx.doi.org/10.5281/zenodo.30978 https://zenodo.org/record/30978 |