Understanding and Exploiting Dependent Variables with Deep Metric Learning

• Main Authors: Mahony, Niall O', Campbell, Sean, Carvalho, Anderson, Krpalkova, Lenka, Velasco-Hernandez, Gustavo, Riordan, Daniel, Walsh, Joseph
• Format: Article in Journal/Newspaper
• Language: unknown
• Published: arXiv 2020
• Subjects: Computer Vision and Pattern Recognition cs.CV; Artificial Intelligence cs.AI; FOS Computer and information sciences; The Gallery; DML
• Online Access: https://dx.doi.org/10.48550/arxiv.2009.03820; https://arxiv.org/abs/2009.03820

Deep Metric Learning (DML) approaches learn to represent inputs to a lower-dimensional latent space such that the distance between representations in this space corresponds with a predefined notion of similarity. This paper investigates how the mapping element of DML may be exploited in situations w...