RepMet: Representative-based metric learning for classification and one-shot object detection
Distance metric learning (DML) has been successfully applied to object classification, both in the standard regime of rich training data and in the few-shot scenario, where each category is represented by only a few examples. In this work, we propose a new method for DML that simultaneously learns t...
| Main Authors: | , , , , , , , |
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| Format: | Report |
| Language: | unknown |
| Published: |
arXiv
2018
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| Subjects: | |
| Online Access: | https://dx.doi.org/10.48550/arxiv.1806.04728 https://arxiv.org/abs/1806.04728 |
| Summary: | Distance metric learning (DML) has been successfully applied to object classification, both in the standard regime of rich training data and in the few-shot scenario, where each category is represented by only a few examples. In this work, we propose a new method for DML that simultaneously learns the backbone network parameters, the embedding space, and the multi-modal distribution of each of the training categories in that space, in a single end-to-end training process. Our approach outperforms state-of-the-art methods for DML-based object classification on a variety of standard fine-grained datasets. Furthermore, we demonstrate the effectiveness of our approach on the problem of few-shot object detection, by incorporating the proposed DML architecture as a classification head into a standard object detection model. We achieve the best results on the ImageNet-LOC dataset compared to strong baselines, when only a few training examples are available. We also offer the community a new episodic benchmark based on the ImageNet dataset for the few-shot object detection task. |
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