Sample handling concept for in-situ lunar regolith analysis by laser-based mass spectrometry ...

We present the current progress in developing a reflectron-type time-of-flight laser ablation ionization mass spectrometer (RTOF-LIMS) to allow for direct sensitive microanalysis of lunar regolith grains in situ on the lunar surface. The LIMS system will operate in the lunar south pole region on a C...

Full description

Bibliographic Details
Main Authors: Keresztes Schmidt, Peter, Hayoz, Sébastien, Piazza, Daniele, Bandy, Timothy, Mändli, Patrik, Blaukovitsch, Matthias, Althaus, Michael, Plet, Benoît Gabriel, Riedo, Sven, Studer, Simon, Studer, Olivier, Bieri, Michael, Tulej, Marek, Riedo, Andreas, Wurz, Peter
Format: Text
Language:unknown
Published: IEEE 2024
Subjects:
Online Access:https://dx.doi.org/10.48350/197502
https://boris.unibe.ch/197502/
Description
Summary:We present the current progress in developing a reflectron-type time-of-flight laser ablation ionization mass spectrometer (RTOF-LIMS) to allow for direct sensitive microanalysis of lunar regolith grains in situ on the lunar surface. The LIMS system will operate in the lunar south pole region on a CLPS mission within NASA’s Artemis program.The concept for the regolith sample handling system, which is based on a carousel disk system with a cavity to hold the sample material, will be discussed in detail. Rotating the disk takes care of transporting the sample material from the sample inlet, into which a sample delivery system of the CLPS platform deposits the regolith, to the analysis position below the mass analyzer entrance and, subsequently, disposing the material after analysis is completed. Sample preparation is achieved by passive brushes and a shaping tool to create a sample surface with the necessary planarity. Accurate control of these parameters is important to ensure consistent laser ablation ...