Atomic Force Microscopy for Martian Investigations

The Phoenix Mars Lander includes a Microscopy, Electrochemistry and Conductivity Analyser (MECA) instrument for the study of dust and regolith at the Martian arctic. The microscopy payload comprises an AFM and Optical Microscope (OM) to which samples are delivered by a robot arm. The setup allows im...

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Main Author: Sykulska-Lawrence, Hanna Maria
Format: Text
Language:unknown
Published: Imperial College London 2008
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Online Access:https://dx.doi.org/10.25560/4396
http://spiral.imperial.ac.uk/handle/10044/1/4396
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spelling ftdatacite:10.25560/4396 2023-05-15T15:12:22+02:00 Atomic Force Microscopy for Martian Investigations Sykulska-Lawrence, Hanna Maria 2008 https://dx.doi.org/10.25560/4396 http://spiral.imperial.ac.uk/handle/10044/1/4396 unknown Imperial College London Text ScholarlyArticle article-journal Doctor of Philosophy (PhD) 2008 ftdatacite https://doi.org/10.25560/4396 2021-11-05T12:55:41Z The Phoenix Mars Lander includes a Microscopy, Electrochemistry and Conductivity Analyser (MECA) instrument for the study of dust and regolith at the Martian arctic. The microscopy payload comprises an AFM and Optical Microscope (OM) to which samples are delivered by a robot arm. The setup allows imaging of individual dust and soil particles at a higher spatial resolution than any other in-situ instrument. A fully functioning test-bed of the flight microscopy setup within an environmental chamber to simulate Mars conditions was assembled at Imperial College, enabling characterization of the microscopes. Samples are collected on small disks rotated to the vertical position for imaging, with each substrate surface promoting different adhesion mechanisms. The vertical mounting necessitates good adhesion of particles to substrates. Moreover, to achieve safe operation and good AFM scans, a sparse field of particles is required. This work investigates models and experimental setups which consider the adhesion mechanisms of particles, including under Mars conditions. These models incorporate the forces from the AFM cantilever during scanning, particle-substrate adhesion and particle-tip adhesion. The solution offered to the problem of unstable particles is substrates with engineered features, micromachined in silicon, to trap and stabilise particles for AFM and reduce the loading of the sample to a suitable level. Various designs were investigated in a series of tests, and a final design was created for a substrate for AFM during the mission. The substrates were fabricated and incorporated on the sample wheel on Phoenix, now on Mars. The MECA results are discussed, focusing in particular on the characterization, calibration and cataloguing of samples using the Imperial College testbed. The best ways of obtaining data from the setup were investigated. These strategies were used during the Phoenix mission. Finally, the extant microscopy data acquired during surface operations are presented and the overall operations procedures discussed. Text Arctic DataCite Metadata Store (German National Library of Science and Technology) Arctic
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collection DataCite Metadata Store (German National Library of Science and Technology)
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description The Phoenix Mars Lander includes a Microscopy, Electrochemistry and Conductivity Analyser (MECA) instrument for the study of dust and regolith at the Martian arctic. The microscopy payload comprises an AFM and Optical Microscope (OM) to which samples are delivered by a robot arm. The setup allows imaging of individual dust and soil particles at a higher spatial resolution than any other in-situ instrument. A fully functioning test-bed of the flight microscopy setup within an environmental chamber to simulate Mars conditions was assembled at Imperial College, enabling characterization of the microscopes. Samples are collected on small disks rotated to the vertical position for imaging, with each substrate surface promoting different adhesion mechanisms. The vertical mounting necessitates good adhesion of particles to substrates. Moreover, to achieve safe operation and good AFM scans, a sparse field of particles is required. This work investigates models and experimental setups which consider the adhesion mechanisms of particles, including under Mars conditions. These models incorporate the forces from the AFM cantilever during scanning, particle-substrate adhesion and particle-tip adhesion. The solution offered to the problem of unstable particles is substrates with engineered features, micromachined in silicon, to trap and stabilise particles for AFM and reduce the loading of the sample to a suitable level. Various designs were investigated in a series of tests, and a final design was created for a substrate for AFM during the mission. The substrates were fabricated and incorporated on the sample wheel on Phoenix, now on Mars. The MECA results are discussed, focusing in particular on the characterization, calibration and cataloguing of samples using the Imperial College testbed. The best ways of obtaining data from the setup were investigated. These strategies were used during the Phoenix mission. Finally, the extant microscopy data acquired during surface operations are presented and the overall operations procedures discussed.
format Text
author Sykulska-Lawrence, Hanna Maria
spellingShingle Sykulska-Lawrence, Hanna Maria
Atomic Force Microscopy for Martian Investigations
author_facet Sykulska-Lawrence, Hanna Maria
author_sort Sykulska-Lawrence, Hanna Maria
title Atomic Force Microscopy for Martian Investigations
title_short Atomic Force Microscopy for Martian Investigations
title_full Atomic Force Microscopy for Martian Investigations
title_fullStr Atomic Force Microscopy for Martian Investigations
title_full_unstemmed Atomic Force Microscopy for Martian Investigations
title_sort atomic force microscopy for martian investigations
publisher Imperial College London
publishDate 2008
url https://dx.doi.org/10.25560/4396
http://spiral.imperial.ac.uk/handle/10044/1/4396
geographic Arctic
geographic_facet Arctic
genre Arctic
genre_facet Arctic
op_doi https://doi.org/10.25560/4396
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