Mineralogy of surface sediment from the Canadian Beaufort Shelf and Amundsen Gulf (Canadian Arctic) ...
For the semi-quantification of the major mineralogical components, bulk sediment XRD scans were processed in the software package X'Pert High-Score Plus (PANalytical) using the Rietveld full-pattern fitting method. This method permits the semi-quantification of whole-sediment mineralogy with a...
Main Authors: | , , , , |
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Format: | Dataset |
Language: | English |
Published: |
PANGAEA
2016
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Subjects: | |
Online Access: | https://dx.doi.org/10.1594/pangaea.866869 https://doi.pangaea.de/10.1594/PANGAEA.866869 |
Summary: | For the semi-quantification of the major mineralogical components, bulk sediment XRD scans were processed in the software package X'Pert High-Score Plus (PANalytical) using the Rietveld full-pattern fitting method. This method permits the semi-quantification of whole-sediment mineralogy with a precision of 5-10% for phyllosilicates and 5% for non-phyllosilicates minerals. The quality of the Rietveld fitting procedure was evaluated for the R-profile and goodness-of-fit (GOF). The R-profile quantifies the difference between the observed and calculated patterns, whereas the GOF is the ratio between the R-weighted profile (RWP; best least-squares fit between observed and calculated patterns) and R-expected theoretical (Rexp; best possible value for the residual). ... |
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