Deep Metric Learning-Based Semi-Supervised Regression with Alternate Learning ...
This paper introduces a novel deep metric learning-based semi-supervised regression (DML-S2R) method for parameter estimation problems. The proposed DML-S2R method aims to mitigate the problems of insufficient amount of labeled samples without collecting any additional sample with a target value. To...
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ftdatacite:10.14279/depositonce-19433 2023-12-31T10:06:17+01:00 Deep Metric Learning-Based Semi-Supervised Regression with Alternate Learning ... Zell, Adina Sumbul, Gencer Demir, Begum 2022 https://dx.doi.org/10.14279/depositonce-19433 https://depositonce.tu-berlin.de/handle/11303/20635 en eng IEEE http://rightsstatements.org/vocab/InC/1.0/ 000 Informatik, Informationswissenschaft, allgemeine Werke000 Informatik, Wissen, Systeme004 Datenverarbeitung; Informatik semi-supervised regression parameter estimation metric learning deep learning article-journal ScholarlyArticle Conference Object Text 2022 ftdatacite https://doi.org/10.14279/depositonce-19433 2023-12-01T11:10:41Z This paper introduces a novel deep metric learning-based semi-supervised regression (DML-S2R) method for parameter estimation problems. The proposed DML-S2R method aims to mitigate the problems of insufficient amount of labeled samples without collecting any additional sample with a target value. To this end, it is made up of two main steps: i) pairwise similarity modeling with scarce labeled data; and ii) triplet-based metric learning with abundant unlabeled data. The first step aims to model pairwise sample similarities by using a small number of labeled samples. This is achieved by estimating the target value differences of labeled samples with a Siamese neural network (SNN). The second step aims to learn a triplet-based metric space (in which similar samples are close to each other and dissimilar samples are far apart from each other) when the number of labeled samples is insufficient. This is achieved by employing the SNN of the first step for triplet-based deep metric learning that exploits not only ... Conference Object DML DataCite Metadata Store (German National Library of Science and Technology) |
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DataCite Metadata Store (German National Library of Science and Technology) |
op_collection_id |
ftdatacite |
language |
English |
topic |
000 Informatik, Informationswissenschaft, allgemeine Werke000 Informatik, Wissen, Systeme004 Datenverarbeitung; Informatik semi-supervised regression parameter estimation metric learning deep learning |
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000 Informatik, Informationswissenschaft, allgemeine Werke000 Informatik, Wissen, Systeme004 Datenverarbeitung; Informatik semi-supervised regression parameter estimation metric learning deep learning Zell, Adina Sumbul, Gencer Demir, Begum Deep Metric Learning-Based Semi-Supervised Regression with Alternate Learning ... |
topic_facet |
000 Informatik, Informationswissenschaft, allgemeine Werke000 Informatik, Wissen, Systeme004 Datenverarbeitung; Informatik semi-supervised regression parameter estimation metric learning deep learning |
description |
This paper introduces a novel deep metric learning-based semi-supervised regression (DML-S2R) method for parameter estimation problems. The proposed DML-S2R method aims to mitigate the problems of insufficient amount of labeled samples without collecting any additional sample with a target value. To this end, it is made up of two main steps: i) pairwise similarity modeling with scarce labeled data; and ii) triplet-based metric learning with abundant unlabeled data. The first step aims to model pairwise sample similarities by using a small number of labeled samples. This is achieved by estimating the target value differences of labeled samples with a Siamese neural network (SNN). The second step aims to learn a triplet-based metric space (in which similar samples are close to each other and dissimilar samples are far apart from each other) when the number of labeled samples is insufficient. This is achieved by employing the SNN of the first step for triplet-based deep metric learning that exploits not only ... |
format |
Conference Object |
author |
Zell, Adina Sumbul, Gencer Demir, Begum |
author_facet |
Zell, Adina Sumbul, Gencer Demir, Begum |
author_sort |
Zell, Adina |
title |
Deep Metric Learning-Based Semi-Supervised Regression with Alternate Learning ... |
title_short |
Deep Metric Learning-Based Semi-Supervised Regression with Alternate Learning ... |
title_full |
Deep Metric Learning-Based Semi-Supervised Regression with Alternate Learning ... |
title_fullStr |
Deep Metric Learning-Based Semi-Supervised Regression with Alternate Learning ... |
title_full_unstemmed |
Deep Metric Learning-Based Semi-Supervised Regression with Alternate Learning ... |
title_sort |
deep metric learning-based semi-supervised regression with alternate learning ... |
publisher |
IEEE |
publishDate |
2022 |
url |
https://dx.doi.org/10.14279/depositonce-19433 https://depositonce.tu-berlin.de/handle/11303/20635 |
genre |
DML |
genre_facet |
DML |
op_rights |
http://rightsstatements.org/vocab/InC/1.0/ |
op_doi |
https://doi.org/10.14279/depositonce-19433 |
_version_ |
1786838259827998720 |