Phase altimetry with dual polarization GNSS-R over sea ice

This paper evaluates the potential use of reflected signals from Global Navigation Satellite Systems as a source of opportunity for the retrieval of absolute ellipsoidal heights over sea ice. Accurate estimation of the surface level would be helpful for the determination of the ice thickness, a key...

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Bibliographic Details
Published in:IEEE Transactions on Geoscience and Remote Sensing
Main Authors: Fabra, Fran, Cardellach, Estel, Rius, Antonio, Ribó, Serni, Oliveras, Santiago, Nogués-Correig, Oleguer, Belmonte Rivas, Maria, Semmling, Maximilian, D'Addio, Salvatore
Other Authors: #NODATA#, Estel Cardellach
Format: Article in Journal/Newspaper
Language:English
Published: Institute of Electrical and Electronics Engineers 2012
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Online Access:http://hdl.handle.net/10261/346615
https://doi.org/10.1109/TGRS.2011.2172797
https://api.elsevier.com/content/abstract/scopus_id/84861344449
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Summary:This paper evaluates the potential use of reflected signals from Global Navigation Satellite Systems as a source of opportunity for the retrieval of absolute ellipsoidal heights over sea ice. Accurate estimation of the surface level would be helpful for the determination of the ice thickness, a key parameter for classification and characterization of sea ice masses. Our analysis is based on altimetric estimations from the coherent differential phase between direct and both cross- and co-polar reflected signals. For this purpose, GPS waveforms have been collected from a fixed platform in Greenland, monitoring the complete process of sea ice formation and melting during a 7-month period. The variability of coherent phase samples and polarimetric measurements are compared with in situ observations to make a realistic rough characterization of the ice cover. The retrieved sea ice surface height estimates are then evaluated against an Arctic tide model, ice surface temperature from moderate-resolution imaging spectroradiometer, and the laser altimetry product from ICESat. © 2011 IEEE. Peer reviewed