Constrained Random Test Environment for SoC Verification using VERA

Tundra Semiconductor is creating the next generation of system interconnect designs. Our typical design supports 10 buses, with at least four of the buses having different protocols. All of the buses map many different transactions from a one bus to another bus. In system verification, every block o...

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Main Authors: Victor Besyakov, David Shleifman
Other Authors: The Pennsylvania State University CiteSeerX Archives
Format: Text
Language:English
Published: 2002
Subjects:
Online Access:http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.83.6803
http://www.open-vera.com/technical/constrained_tundra.pdf
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spelling ftciteseerx:oai:CiteSeerX.psu:10.1.1.83.6803 2023-05-15T18:40:25+02:00 Constrained Random Test Environment for SoC Verification using VERA Victor Besyakov David Shleifman The Pennsylvania State University CiteSeerX Archives 2002 application/pdf http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.83.6803 http://www.open-vera.com/technical/constrained_tundra.pdf en eng http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.83.6803 http://www.open-vera.com/technical/constrained_tundra.pdf Metadata may be used without restrictions as long as the oai identifier remains attached to it. http://www.open-vera.com/technical/constrained_tundra.pdf text 2002 ftciteseerx 2016-01-08T19:25:31Z Tundra Semiconductor is creating the next generation of system interconnect designs. Our typical design supports 10 buses, with at least four of the buses having different protocols. All of the buses map many different transactions from a one bus to another bus. In system verification, every block of the design must undergo detailed block level verification. Because of the complexity of the designs and the amount of resource and time associated with verification efforts it is almost impossible to complete 100 % functional coverage. However, if the functional verification is targeted to three to five typical applications where the device is going to be used, then the desired coverage is reduced which also reduces verification time. In this document, we describe the criteria to effectively exercise multiprotocol traffic. Based on these criteria we demonstrate how to assert hierarchal constraints in order to reproduce “real world” traffic. Finally, we describe System Scenario Generator (SSG) that implements these hierarchal constraints. The SSG is scalable to support any number of buses of the same type, is expandable to accommodate buses with new protocols, and is adjustable to incrementally shift Text Tundra Unknown
institution Open Polar
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op_collection_id ftciteseerx
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description Tundra Semiconductor is creating the next generation of system interconnect designs. Our typical design supports 10 buses, with at least four of the buses having different protocols. All of the buses map many different transactions from a one bus to another bus. In system verification, every block of the design must undergo detailed block level verification. Because of the complexity of the designs and the amount of resource and time associated with verification efforts it is almost impossible to complete 100 % functional coverage. However, if the functional verification is targeted to three to five typical applications where the device is going to be used, then the desired coverage is reduced which also reduces verification time. In this document, we describe the criteria to effectively exercise multiprotocol traffic. Based on these criteria we demonstrate how to assert hierarchal constraints in order to reproduce “real world” traffic. Finally, we describe System Scenario Generator (SSG) that implements these hierarchal constraints. The SSG is scalable to support any number of buses of the same type, is expandable to accommodate buses with new protocols, and is adjustable to incrementally shift
author2 The Pennsylvania State University CiteSeerX Archives
format Text
author Victor Besyakov
David Shleifman
spellingShingle Victor Besyakov
David Shleifman
Constrained Random Test Environment for SoC Verification using VERA
author_facet Victor Besyakov
David Shleifman
author_sort Victor Besyakov
title Constrained Random Test Environment for SoC Verification using VERA
title_short Constrained Random Test Environment for SoC Verification using VERA
title_full Constrained Random Test Environment for SoC Verification using VERA
title_fullStr Constrained Random Test Environment for SoC Verification using VERA
title_full_unstemmed Constrained Random Test Environment for SoC Verification using VERA
title_sort constrained random test environment for soc verification using vera
publishDate 2002
url http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.83.6803
http://www.open-vera.com/technical/constrained_tundra.pdf
genre Tundra
genre_facet Tundra
op_source http://www.open-vera.com/technical/constrained_tundra.pdf
op_relation http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.83.6803
http://www.open-vera.com/technical/constrained_tundra.pdf
op_rights Metadata may be used without restrictions as long as the oai identifier remains attached to it.
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