Comparison of Simulated 2D Temperature Profiles with Time-Lapse Electrical Resistivity Data at the Schilthorn Crest, Switzerland

• Main Authors: Jeannette Noetzli, Christin Hilbich, Christian Hauck, Martin Hoelzle, Stephan Gruber
• Other Authors: The Pennsylvania State University CiteSeerX Archives
• Format: Text
• Language: English
• Subjects: alpine permafrost distribution; electrical resistivity; thermal modeling; Crest The; permafrost
• Online Access: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.525.3684; http://www.geo.unizh.ch/~jnoetzli/downloads/Noetzli2008_Schilthorn.pdf

The Schilthorn Crest in the Bernese Alps, Switzerland, is a prominent permafrost research site. Topographic and transient effects influence the temperature field below the east-west oriented crest. Measured T(z)-profiles in boreholes, however, do not provide sufficient information for a comprehensive description of the subsurface temperature distribution. We combine ground temperature measurements, electric resistivity tomography (ERT) monitoring, and numerical modeling to investigate the 3-dimensional thermal regime below the crest. The modeled temperature field of a north-south oriented cross section agrees well with ERT results along the same profile. The simulated thermal regime below the Schilthorn is characterized by generally warm permafrost, with the coldest zone below the upper part of the north-facing slope, and permafrost a little below the surface on the south-facing slope. The combination of temperature modeling and measurements and geophysical monitoring bears potential to improve simulation and validation strategies.