Influence of work function on the multipactor threshold

International audience The multipactor effect is characterized by a very fast growth of the electronic population in vacuum Radio-Frequency (RF) devices. As it limits the transmitted RF power and can severely damage RF systems, multipactor has been subject to an extensive research for the past decad...

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Bibliographic Details
Main Authors: Plaçais, Adrien, Sorolla, Eden, Belhaj, Mohamed, Hillairet, Julien, Puech, Jérôme
Other Authors: DPHY, ONERA, Université de Toulouse Toulouse, ONERA-PRES Université de Toulouse, Institut de Recherche sur la Fusion par confinement Magnétique (IRFM), Direction de Recherche Fondamentale (CEA) (DRF (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Centre National d'Études Spatiales Toulouse (CNES), Systèmes RF (XLIM-SRF), XLIM (XLIM), Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS)-Université de Limoges (UNILIM)-Centre National de la Recherche Scientifique (CNRS)
Format: Conference Object
Language:English
Published: HAL CCSD 2018
Subjects:
Online Access:https://hal.science/hal-02262204
https://hal.science/hal-02262204/document
https://hal.science/hal-02262204/file/DPHY19048.1564063556_preprint.pdf
Description
Summary:International audience The multipactor effect is characterized by a very fast growth of the electronic population in vacuum Radio-Frequency (RF) devices. As it limits the transmitted RF power and can severely damage RF systems, multipactor has been subject to an extensive research for the past decades. Simulation tools are relatively accurate for the simplest cases, but less reliable for advanced problems: presence of an external magnetic field, complex geometry, time or temperature-dependent materials properties, etc. A code simulating the multipactor within an infinite parallel-plate waveguide with a dielectric coating on the bottom plate has been developed. The inclusion of a realistic energy distribution for the secondary electrons and a new emission model shows a strong dependence of the multipactor threshold on the metal work function and on the dielectric electric charge.