Larue, F., Picard, G., Arnaud, L., Ollivier, I., Delcourt, C., Lamare, M., . . . (CNRS), I. n. d. s. d. l. F. N. d. l. R. S. (2020). Snow albedo sensitivity to macroscopic surface roughness using a new ray-tracing model. The Cryosphere, 14(5), 1651.
Chicago Style (17th ed.) CitationLarue, Fanny, et al. "Snow Albedo Sensitivity to Macroscopic Surface Roughness Using a New Ray-tracing Model." The Cryosphere 14, no. 5 (2020): 1651.
MLA (9th ed.) CitationLarue, Fanny, et al. "Snow Albedo Sensitivity to Macroscopic Surface Roughness Using a New Ray-tracing Model." The Cryosphere, vol. 14, no. 5, 2020, p. 1651.
Warning: These citations may not always be 100% accurate.