High resolution structural investigation of synthetic and natural 2:1 clay-mineral assemblages using advanced sample preparation and electron microscopy imaging techniques

In this study, X-ray diffraction (XRD), high-resolution transmission electron microscopy (HRTEM), and conventional TEM (CTEM) of Pt-C replicas are used to characterize both synthetic and natural 2:1 clay minerals from a variety of geological environments. In manuscript 1, reference samples of illite...

Full description

Bibliographic Details
Main Author: Schumann, Dirk
Other Authors: Hojatollah Vali (Internal/Cosupervisor2), Reinhard Hesse (Internal/Supervisor)
Format: Thesis
Language:English
Published: McGill University 2012
Subjects:
Online Access:http://digitool.Library.McGill.CA:80/R/?func=dbin-jump-full&object_id=106372