Deep Metric Learning-Based Semi-Supervised Regression With Alternate Learning
This paper introduces a novel deep metric learning-based semi-supervised regression (DML-S2R) method for parameter estimation problems. The proposed DML-S2R method aims to mitigate the problems of insufficient amount of labeled samples without collecting any additional sample with a target value. To...
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ftarxivpreprints:oai:arXiv.org:2202.11388 2023-09-05T13:19:05+02:00 Deep Metric Learning-Based Semi-Supervised Regression With Alternate Learning Zell, Adina Sumbul, Gencer Demir, Begüm 2022-02-23 http://arxiv.org/abs/2202.11388 https://doi.org/10.1109/ICIP46576.2022.9897939 unknown http://arxiv.org/abs/2202.11388 doi:10.1109/ICIP46576.2022.9897939 Computer Science - Computer Vision and Pattern Recognition Computer Science - Machine Learning text 2022 ftarxivpreprints https://doi.org/10.1109/ICIP46576.2022.9897939 2023-08-16T16:56:42Z This paper introduces a novel deep metric learning-based semi-supervised regression (DML-S2R) method for parameter estimation problems. The proposed DML-S2R method aims to mitigate the problems of insufficient amount of labeled samples without collecting any additional sample with a target value. To this end, it is made up of two main steps: i) pairwise similarity modeling with scarce labeled data; and ii) triplet-based metric learning with abundant unlabeled data. The first step aims to model pairwise sample similarities by using a small number of labeled samples. This is achieved by estimating the target value differences of labeled samples with a Siamese neural network (SNN). The second step aims to learn a triplet-based metric space (in which similar samples are close to each other and dissimilar samples are far apart from each other) when the number of labeled samples is insufficient. This is achieved by employing the SNN of the first step for triplet-based deep metric learning that exploits not only labeled samples but also unlabeled samples. For the end-to-end training of DML-S2R, we investigate an alternate learning strategy for the two steps. Due to this strategy, the encoded information in each step becomes a guidance for learning phase of the other step. The experimental results confirm the success of DML-S2R compared to the state-of-the-art semi-supervised regression methods. The code of the proposed method is publicly available at https://git.tu-berlin.de/rsim/DML-S2R. Comment: Accepted at IEEE International Conference on Image Processing (ICIP) 2022. Our code is available at https://git.tu-berlin.de/rsim/DML-S2R Text DML ArXiv.org (Cornell University Library) 2022 IEEE International Conference on Image Processing (ICIP) 2411 2415 |
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Computer Science - Computer Vision and Pattern Recognition Computer Science - Machine Learning |
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Computer Science - Computer Vision and Pattern Recognition Computer Science - Machine Learning Zell, Adina Sumbul, Gencer Demir, Begüm Deep Metric Learning-Based Semi-Supervised Regression With Alternate Learning |
topic_facet |
Computer Science - Computer Vision and Pattern Recognition Computer Science - Machine Learning |
description |
This paper introduces a novel deep metric learning-based semi-supervised regression (DML-S2R) method for parameter estimation problems. The proposed DML-S2R method aims to mitigate the problems of insufficient amount of labeled samples without collecting any additional sample with a target value. To this end, it is made up of two main steps: i) pairwise similarity modeling with scarce labeled data; and ii) triplet-based metric learning with abundant unlabeled data. The first step aims to model pairwise sample similarities by using a small number of labeled samples. This is achieved by estimating the target value differences of labeled samples with a Siamese neural network (SNN). The second step aims to learn a triplet-based metric space (in which similar samples are close to each other and dissimilar samples are far apart from each other) when the number of labeled samples is insufficient. This is achieved by employing the SNN of the first step for triplet-based deep metric learning that exploits not only labeled samples but also unlabeled samples. For the end-to-end training of DML-S2R, we investigate an alternate learning strategy for the two steps. Due to this strategy, the encoded information in each step becomes a guidance for learning phase of the other step. The experimental results confirm the success of DML-S2R compared to the state-of-the-art semi-supervised regression methods. The code of the proposed method is publicly available at https://git.tu-berlin.de/rsim/DML-S2R. Comment: Accepted at IEEE International Conference on Image Processing (ICIP) 2022. Our code is available at https://git.tu-berlin.de/rsim/DML-S2R |
format |
Text |
author |
Zell, Adina Sumbul, Gencer Demir, Begüm |
author_facet |
Zell, Adina Sumbul, Gencer Demir, Begüm |
author_sort |
Zell, Adina |
title |
Deep Metric Learning-Based Semi-Supervised Regression With Alternate Learning |
title_short |
Deep Metric Learning-Based Semi-Supervised Regression With Alternate Learning |
title_full |
Deep Metric Learning-Based Semi-Supervised Regression With Alternate Learning |
title_fullStr |
Deep Metric Learning-Based Semi-Supervised Regression With Alternate Learning |
title_full_unstemmed |
Deep Metric Learning-Based Semi-Supervised Regression With Alternate Learning |
title_sort |
deep metric learning-based semi-supervised regression with alternate learning |
publishDate |
2022 |
url |
http://arxiv.org/abs/2202.11388 https://doi.org/10.1109/ICIP46576.2022.9897939 |
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DML |
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DML |
op_relation |
http://arxiv.org/abs/2202.11388 doi:10.1109/ICIP46576.2022.9897939 |
op_doi |
https://doi.org/10.1109/ICIP46576.2022.9897939 |
container_title |
2022 IEEE International Conference on Image Processing (ICIP) |
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2411 |
op_container_end_page |
2415 |
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1776199888236707840 |