Summary: | Temperature profile and other data were collected using CTD casts from NOAA Ship RESEARCHER in the North Atlantic Ocean from 22 January 1980 to 03 February 1980. Data were collected by the Atlantic Oceanographic and Meteorological Laboratory (AOML) in Miami, Florida. Data were processed by NODC to the NODC standard High-Resolution STD/CTD Data (F022) format. Full format description is available from NODC at www.nodc.noaa.gov/General/NODC-Archive/f022.html. The F022 format contains high-resolution data collected using CTD (conductivity-temperature-depth) and STD (salinity-temperature-depth) instruments. As they are lowered and raised in the oceans, these electronic devices provide nearly continuous profiles of temperature, salinity, and other parameters. Data values may be subject to averaging or filtering or obtained by interpolation and may be reported at depth intervals as fine as 1m. Cruise and instrument information, position, date, time and sampling interval are reported for each station. Environmental data at the time of the cast (meteorological and sea surface conditions) may also be reported. The data record comprises values of temperature, salinity or conductivity, density (computed sigma-t), and possibly dissolved oxygen or transmissivity at specified depth or pressure levels. Data may be reported at either equally or unequally spaced depth or pressure intervals. A text record is available for comments.
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