New measurement technique for characterizing small extraterrestrial materials by X‐ray diffraction using the Gandolfi attachment

• Published in: Meteoritics & Planetary Science
• Main Authors: Imae, Naoya, Kimura, Makoto
• Other Authors: Japan Society for the Promotion of Science
• Format: Article in Journal/Newspaper
• Language: English
• Published: Wiley 2020
• Subjects: Antarctic; Index Peak; Antarc*
• Online Access: https://doi.org/10.1111/maps.13491; https://onlinelibrary.wiley.com/doi/pdf/10.1111/maps.13491; https://onlinelibrary.wiley.com/doi/full-xml/10.1111/maps.13491

Abstract Identification and characterization of small extraterrestrial samples, such as small Antarctic meteorites <~1 cm, require the development of convenient laboratory‐based nondestructive analytical techniques using X‐ray diffraction (XRD). We explore the characterization criteria using an X...