APA (7th ed.) Citation

Imae, N., Kimura, M., & Science, J. S. f. t. P. o. (2020). New measurement technique for characterizing small extraterrestrial materials by X‐ray diffraction using the Gandolfi attachment. Meteoritics & Planetary Science, 56(1), 174.

Chicago Style (17th ed.) Citation

Imae, Naoya, Makoto Kimura, and Japan Society for the Promotion of Science. "New Measurement Technique for Characterizing Small Extraterrestrial Materials by X‐ray Diffraction Using the Gandolfi Attachment." Meteoritics & Planetary Science 56, no. 1 (2020): 174.

MLA (9th ed.) Citation

Imae, Naoya, et al. "New Measurement Technique for Characterizing Small Extraterrestrial Materials by X‐ray Diffraction Using the Gandolfi Attachment." Meteoritics & Planetary Science, vol. 56, no. 1, 2020, p. 174.